Patent · US Expired

Projection exposure apparatus and method in which mask stage is moved to provide alignment with a moving wafer stage

US5978071A · kind A · utility

27Cited by
18References
53Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 26, 1998
Grant dateNov 2, 1999
Priority date
Expiry dateMay 26, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F9/70
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A projection exposure apparatus for positioning, for each shot provided on a wafer, a pattern formed on a mask with respect to the wafer and also for exposing the pattern on the wafer includes a wafer stage carrying the wafer and movable stepwise for each shot, a mask stage carrying the mask and movable, a stage control unit for making relative positioning between the wafer and the pattern of the mask and maintaining the relative positioning so that the stage control unit moves the mask stage to make the relative positioning before the wafer stage stops for each shot, and an exposure control unit for performing exposure while the relative positioning is maintained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.