Patent · US Expired

Method of and apparatus for igniting a plasma in an r.f. plasma processor

US5982099A · kind A · utility

87Cited by
13References
37Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 29, 1996
Grant dateNov 9, 1999
Priority date
Expiry dateMar 29, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05H1/36
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A gas in a vacuum plasma processing chamber is ignited to a plasma by subjecting the gas to an r.f. field derived from an r.f. source having a frequency and power level sufficient to ignite the gas into the plasma and to maintain the plasma. The r.f. field is supplied to the gas by a reactive impedance element connected via a matching network to the r.f. source. The matching network includes first and second variable reactances that control loading of the source and tuning a load, including the reactive impedance element and the plasma, to the source. The value of only one of the reactances is varied until a local maximum of a function of power coupled between the source and the load is reached. The value of only the other reactance is varied until a local maximum of the function is reached. The two varying steps are then repeated as necessary.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.