Patent · US Expired

Method for making three dimensional circuit integration

US5998292A · kind A · utility

480Cited by
0References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 12, 1997
Grant dateDec 7, 1999
Priority date
Expiry dateNov 12, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a method for interconnecting, through high-density micro-post wiring, multiple semiconductor wafers with lengths of about a millimeter or below. Specifically, the method of the present invention comprises etching at least one hole, defined by walls, at least partly through a semiconducting material; forming a layer of electrically insulating material to cover said walls; and forming an electrically conductive material on said walls within the channel of the hole. Microelectronic devices containing the micro-post wiring of the present invention are also disclosed herein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.