Integrated circuit tester with compensation for leakage current
US5999008A · kind A · utility
13Cited by
6References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 30, 1997 |
| Grant date | Dec 7, 1999 |
| Priority date | — |
| Expiry date | Apr 30, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.