Jeffrey D. Currin
9Patents
7h-index
10Co-inventors
56Inventor score
Filing activity: Oct 13, 1995 → Jul 2, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5684421A | Compensated delay locked loop timing vernier | Electricity | 117 | Expired |
| US5883523A | Coherent switching power for an analog circuit tester | Physics | 108 | Expired |
| US6104223A | Calibratable programmable phase shifter | Electricity | 34 | Expired |
| US6087843A | Integrated circuit tester with test head including regulating capacitor | Physics | 31 | Expired |
| US6330197A | System for linearizing a programmable delay circuit | Electricity | 20 | Expired |
| US5999008A | Integrated circuit tester with compensation for leakage current | Physics | 13 | Expired |
| US5789958A | Apparatus for controlling timing of signal pulses | Physics | 11 | Expired |
| US6194911A | Integrated circuit tester with compensation for leakage current | Physics | 5 | Expired |
| US8295182B2 | Routed event test system and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.