Method, apparatus and system for voltage screening of integrated circuits
US5999466A · kind A · utility
16Cited by
7References
38Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 13, 1998 |
| Grant date | Dec 7, 1999 |
| Priority date | — |
| Expiry date | Jan 13, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, apparatus and system for cost-effectively quantifying the likelihood of operational reliability problems includes a supply voltage configuration circuit and a test mode generation circuit. The test mode generation circuit and supply voltage configuration circuit, operating together in a test mode, provide selected supply voltages to selected circuit blocks of an integrated circuit. In non-test operation, the test mode generation circuit and the supply voltage configuration circuit are transparent to the operation of the tested integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.