Method and apparatus for measuring localized voltages on programmable integrated circuits
US6002991A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 24, 1998 |
| Grant date | Dec 14, 1999 |
| Priority date | — |
| Expiry date | Mar 24, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/245
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.