Patent · US Expired

Composite interconnection element for microelectronic components, and method of making same

US6029344A · kind A · utility

228Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 12, 1998
Grant dateFeb 29, 2000
Priority date
Expiry dateAug 12, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49609
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Interconnection elements for electronic components, exhibiting desirable mechanical characteristics (such as resiliency, for making pressure contacts) are formed by shaping an elongate element (core) of a soft material (such as gold) to have a springable shape (including cantilever beam, S-shape, U-shape), and overcoating the shaped elongate element with a hard material (such as nickel and its alloys), to impart a desired spring (resilient) characteristic to the resulting composite interconnection element. A final overcoat of a material having superior electrical qualities (e.g., electrical conductivity and/or solderability) may be applied to the composite interconnection element. The elongate element may be formed from a wire, or from a sheet (e.g., metal foil). The resulting interconnection elements may be mounted to a variety of electronic components, including directly to semiconductor dies and wafers (in which case the overcoat material anchors the composite interconnection element to a terminal (or the like) on the electronic component), may be mounted to support substrates for use as interposers and may be mounted to substrates for use as probe cards or probe card inserts. I…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.