Method for mapping and adjusting pressure distribution of CMP processes
US6033987A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 15, 1999 |
| Grant date | Mar 7, 2000 |
| Priority date | — |
| Expiry date | Jan 15, 2019 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB24B37/04
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A method for chemically-and-mechanically polishing a semiconductor wafer surface is disclosed. It includes the steps of: (a) providing a mechanical polishing pad; (b) placing a pressure-sensitive film on top of a wafer surface to be polished by the mechanical polishing pad, the pressure-sensitive film contains materials that will show pressure-dependent colors when subject to an external pressure; (c) commencing a chemically-and-mechanically polishing process so that the mechanical polishing pad exerts a pressure on the pressure-sensitive film; (d) scanning the pressure-dependent color pattern on the pressure-sensitive film; (e) converting the pressure-dependent color pattern into a pressure distribution; and (f) adjusting the mechanical polishing pad, or a leveling of the wafer mounting, or both, according to the pressure distribution obtained in step (e).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.