Patent · US Expired

Non-volatile memory with improved sensing and method therefor

US6044019A · kind A · utility

158Cited by
2References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 1998
Grant dateMar 28, 2000
Priority date
Expiry dateOct 23, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5645
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Floating gate memories such as EEPROM and flash EEPROM have the memory state of a memory cell thereof determined by sensing the conduction current of the cell. Inherent noise fluctuations in the conduction current during sensing are canceled out by averaging the sensing over a predetermined period of time. In one embodiment, as an integral part of the averaging process, the averaged conduction current is obtained directly as a digital memory state. Accuracy in sensing is therefore greatly improved by avoiding sensing noise with the current and avoiding having to resolve its memory state in the analog domain by comparison with another noisy reference current. In another embodiment, conventional sensing techniques are improved when sensing is made by comparison with a reference current by means of a symmetric, switched or non-switched capacitor differential amplifier. The improved sensing accuracy allows higher resolution of conduction states, thereby allowing a cell to store substantially more than one bit of information.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.