System for evaluating and reporting semiconductor test processes
US6070131A · kind A · utility
2Cited by
2References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 26, 1997 |
| Grant date | May 30, 2000 |
| Priority date | — |
| Expiry date | Sep 26, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L22/22
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A system is disclosed for evaluating relevant data across independent test sequences and providing a consumable output to give a tester an accurate account of the test data. A method for reporting the results of the test processes includes several steps. First, repair, trending, characterization, timing and engineering data for two separate test sequences are read. Next, the data is compared. Also, an analytical report of the test data comparisons is assembled and output.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.