Tim Damon
8Patents
5h-index
6Co-inventors
48Inventor score
Filing activity: Sep 26, 1997 → Jan 13, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6510533B1 | Method for detecting or repairing intercell defects in more than one array of a memory device | Physics | 10 | Expired |
| US6256593A | System for evaluating and reporting semiconductor test processes | Electricity | 9 | Expired |
| US6424161B1 | Apparatus and method for testing fuses | Electricity | 7 | Expired |
| US6762608B2 | Apparatus and method for testing fuses | Electricity | 5 | Expired |
| US6167541A | Method for detecting or preparing intercell defects in more than one array of a memory device | Physics | 5 | Expired |
| US6410352B2 | Apparatus and method for testing fuses | Electricity | 4 | Expired |
| US6070131A | System for evaluating and reporting semiconductor test processes | Electricity | 2 | Expired |
| US7464308B2 | CAM expected address search testmode | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.