Hemispherical test head for integrated circuit tester employing radially distributed circuit cards
US6078187A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 27, 1998 |
| Grant date | Jun 20, 2000 |
| Priority date | — |
| Expiry date | Jan 27, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2889
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test head for an integrated circuit tester includes a set of wedge-shaped node cards, one for each terminal of the integrated circuit device under test (DUT). Each node card holds circuits for carrying out all test activities at one DUT terminal including generating and transmitting a test signal to the DUT and receiving and processing a response signal produced by the DUT. The test and response signals pass through an I/O terminal at a narrow end of the node card. A card frame having hemispherical inner and outer shells holds the node cards substantially therebetween with the I/O terminal of each card protruding through an aperture in the inner shell. A centroid distributor having substantially a hemispherical shaped surface nesting within the inner shell of the card frame holds a set of first terminals in contact with the node card I/O terminals. A set of conductors within the centroid distributor interconnect each first terminal with a corresponding second terminal on a flat surface of the distributor. A load board assembly holds the DUT and a connector assembly links each second terminal of the centroid distributor to a contact on the load board providing access to a DUT term…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.