Integrated circuit tester with test head including regulating capacitor
US6087843A · kind A · utility
31Cited by
5References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 14, 1997 |
| Grant date | Jul 11, 2000 |
| Priority date | — |
| Expiry date | Jul 14, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Current consumption of a device under test (DUT) is measured using a tester including a device power supply (DPS) having force and return lines terminating in respective power supply terminals. The DUT is removably received by a load board having contact elements which are in electrically conductive pressure contact with the power supply terminals of the force and return lines and are connected to power supply pins of the DUT. A circuit branch including a bypass capacitor and an nMOSFET is connected between the force and return lines.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.