Patent · US Expired

Method for production of semiconductor device

US6090701A · kind A · utility

45Cited by
6References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 20, 1995
Grant dateJul 18, 2000
Priority date
Expiry dateJun 20, 2015

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76882
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for the production of a semiconductor device having an electrode line formed in a semiconducting substrate is disclosed which comprises preparing a semiconducting substrate having trenches and/or contact holes formed preparatorily in a region destined to form the electrode line, forming a conductive film formed mainly of at least one member selected from among Cu, Ag, and Au on the surface of the semiconducting substrate, heat-treating the superposed Cu film while supplying at least an oxidizing gas thereto thereby flowing the Cu film to fill the trenches and/or contact holes, and removing by polishing the part of the conductive film which falls outside the region of the electrode line and completing the electrode lines consequently. During the heat treatment, a reducing gas is supplied in addition to the oxidizing gas to induce a local oxidation-reduction reaction and fluidify and/or flow the conductive film and consequently accomplish the embodiment of the conductive film in the trenches.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.