Patent · US Expired

Process and device for polishing semiconductor wafers

US6095898A · kind A · utility

38Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 28, 1998
Grant dateAug 1, 2000
Priority date
Expiry dateOct 28, 2018

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A process and device for polishing semiconductor wafers has at least one side of at least one semiconductor wafer pressed against a polishing plate, over which a polishing cloth is stretched. The semiconductor wafer and the polishing plate are moved relative to each other to polish the wafer. During the polishing, the semiconductor wafer passes over at least two regions on the polishing plate, which regions have defined radial widths and are at different temperatures. Temperature-control means are provided in the polishing plate, with the aid of which the number, the radial widths and the temperatures of the regions are fixed before the semiconductor wafers are polished.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.