Patent · US Expired

Method for simultaneously forming a storage-capacitor electrode and interconnect

US6124199A · kind A · utility

22Cited by
29References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 28, 1999
Grant dateSep 26, 2000
Priority date
Expiry dateApr 28, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/682
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A DRAM memory cell array includes a wiring layer formed at a storage-capacitor level of the cell for establishing a flipped connection of complementary bit lines, or for connecting support circuits in a DRAM cell array. The wiring layer includes a lower capacitor electrode and upper capacitor electrode which are formed simultaneously with respective plates of a storage capacitor. Both capacitor electrodes may be used to form distinct interconnections within a DRAM cell array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.