Patent · US Expired

Drying processing method and apparatus using same

US6134807A · kind A · utility

524Cited by
26References
10Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMay 15, 1998
Grant dateOct 24, 2000
Priority date
Expiry dateMay 15, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67034
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A drying processing apparatus for supplying a dry gas to a processing chamber 35, which houses therein semiconductor wafers W, to dry the semiconductor wafers W, including a heater 32 for heating N.sub.2 gas serving as a carrier gas; a vapor generator 34 for making IPA misty by using the N.sub.2 gas heated by the heater 32 and for heating the IPA to produce the dry gas; and a flow control element 36 for supplying a predetermined rate of N.sub.2 gas to the processing chamber 35. Thus, it is possible to improve the efficiency of heat transfer of N.sub.2 gas, and it is possible to increase the amount of produced IPA gas and decrease the time to produce IPA gas. In addition, it is possible to prevent the turbulence of atmosphere in the processing chamber 35 after the drying processing is completed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.