Patent · US Expired

Magnetic random access memory and fabricating method thereof

US6165803A · kind A · utility

99Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 17, 1999
Grant dateDec 26, 2000
Priority date
Expiry dateMay 17, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N50/01
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

An improved and novel fabrication method for a magnetic element, and more particularly its use in a magnetoresistive random access memory (MRAM) is provided. An MRAM device has memory elements and circuitry for managing the memory elements. The circuitry includes transistor (12a), digit line (29), etc., which are integrated on a substrate (11). The circuitry is fabricated first under the CMOS process and then magnetic memory elements (43, 44) are defined by transforming portions (42b) of a magnetic blanket layer into an insulative material. The magnetic blanket layer, which includes magnetic layers (40,42) and a non-magnetic layer (41) sandwiched by the magnetic layers, which are deposited on conductor layer (34). The insulative, or inactive, portions (42b) define and separate the plurality of memory elements (43, 44).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.