Electro-optic probe
US6166845A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | May 25, 1999 |
| Grant date | Dec 26, 2000 |
| Priority date | — |
| Expiry date | May 25, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R13/347
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a probe for an electro-optic sampling oscillator. The probe for an electro-optic sampling oscillator provides a laser diode that generates a laser beam based on the control signal of the electro-optical sampling oscilloscope; a collimator lens that makes the laser beam into a parallel beam; an electro-optic element that has a reflecting film at the end; an isolator provided between the collimator lens and the electro-optic element that passes the laser beam that is generated by the laser diode and separates the reflected beam of the laser beam that was reflected by the reflecting film; photodiodes that convert the reflected beam separated by the isolator into an electrical signal; and a condenser lens provided between the isolator and the electro-optic element that condenses the parallel beam to one point on the reflecting film, makes the reflected beam reflected by the reflecting film into a parallel beam again, and makes the optical axes of the light incident on the reflecting film and the light reflected by the reflecting film coincide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.