Inventor · Tokyo, JP

Katsushi Ohta

22Patents
4h-index
20Co-inventors
63Inventor score

Filing activity: Jan 28, 1998 → Aug 31, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US7818556B2 Storage apparatus, control method, and control device which can be reliably started up when power is turned on even after there is an error during firmware update Physics 18 Active
US6166845A Electro-optic probe Physics 15 Expired
US5943349A Variable wavelength laser device Electricity 9 Expired
US6429669B1 Temperature-insensitive electro-optic probe Physics 6 Expired
US6297651A Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module Physics 4 Expired
US6410906B1 Electro-optic probe Physics 4 Expired
US6445198B1 Electro-optic sampling probe and a method for adjusting the same Physics 3 Expired
US6337565B1 Electro-optic probe Physics 3 Expired
US6469528B2 Electro-optic sampling probe and measuring method using the same Physics 3 Expired
US6288531A Probe for electro-optic sampling oscilloscope Physics 2 Expired
US6507014B2 Electro-optic probe Physics 2 Expired
US6297650A Electrooptic probe Physics 2 Expired
US6407561B1 Probe for electro-optic sampling oscilloscope Physics 2 Expired
US6369562B2 Electro-optical probe for oscilloscope measuring signal waveform Physics 2 Expired
US6388454B1 Electro-optic sampling prober Physics 1 Expired
US6342783B1 Electrooptic probe Physics 1 Expired
US10684952B2 Disk device and disk device control method Emerging Cross-Sectional Technologies 1 Active
US5936982A Variable wavelength laser light source Electricity 1 Expired
US6403946B1 Electro-optic sampling probe comprising photodiodes insulated from main frame of EOS optical system Physics 0 Expired
US6348787B1 Electrooptic probe Physics 0 Expired
US6560003B2 Light receiving module and light receiving method with reduced polarization dependence Physics 0 Expired
US9053746B2 Disk device and data recording method Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.