Integrated circuit tester with compensation for leakage current
US6194911A · kind A · utility
5Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 11, 1999 |
| Grant date | Feb 27, 2001 |
| Priority date | — |
| Expiry date | May 11, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3191
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In an integrated circuit tester module, pin electronics circuitry supplies leakage current to a circuit node which is connected to a signal pin of a device under test. The leakage current is compensated by connecting the circuit node to a voltage source at a first potential level, supplying current to the circuit node from a second potential level, and measuring current supplied to the circuit node from the voltage source. The second potential level is selectively varied in a manner such as to reduce the current supplied from the voltage source substantially to zero. The circuit node is then disconnected from the voltage source.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.