Non-contact electrical conduction measurement for insulating films
US6202029A · kind A · utility
64Cited by
14References
10Claims
0Family size
Inventors
Key dates
| Filing date | Jun 20, 2000 |
| Grant date | Mar 13, 2001 |
| Priority date | — |
| Expiry date | Jun 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2648
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A corona source is used to apply charge to an insulating layer. The resulting voltage over time is used to determine the current through the layer. The resulting data determines a current-voltage characteristic for the layer and may be used to determine the tunneling field for the layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.