Gregory S. Horner
24Patents
10h-index
23Co-inventors
75Inventor score
Filing activity: Jul 7, 1995 → Dec 5, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6121783A | Method and apparatus for establishing electrical contact between a wafer and a chuck | Electricity | 95 | Expired |
| US6097196A | Non-contact tunnelling field measurement for a semiconductor oxide layer | Physics | 83 | Expired |
| US5594247A | Apparatus and method for depositing charge on a semiconductor wafer | Electricity | 82 | Expired |
| US6191605A | Contactless method for measuring total charge of an insulating layer on a substrate using corona charge | Physics | 76 | Expired |
| US6202029A | Non-contact electrical conduction measurement for insulating films | Physics | 64 | Expired |
| US6060709A | Apparatus and method for depositing uniform charge on a thin oxide semiconductor wafer | Electricity | 50 | Expired |
| US6734696B2 | Non-contact hysteresis measurements of insulating films | Physics | 48 | Expired |
| US7012438B1 | Methods and systems for determining a property of an insulating film | Electricity | 41 | Expired |
| US7248062B1 | Contactless charge measurement of product wafers and control of corona generation and deposition | Electricity | 20 | Expired |
| US6522158B1 | Non-contact mobile charge measurement with leakage band-bending and dipole correction | Physics | 13 | Expired |
| US6771092B1 | Non-contact mobile charge measurement with leakage band-bending and dipole correction | Physics | 10 | Expired |
| US7075318B1 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Physics | 10 | Expired |
| US7064565B1 | Methods and systems for determining an electrical property of an insulating film | Physics | 9 | Expired |
| US8299416B2 | High speed quantum efficiency measurement apparatus utilizing solid state lightsource | Emerging Cross-Sectional Technologies | 8 | Active |
| US7358748B1 | Methods and systems for determining a property of an insulating film | Electricity | 7 | Expired |
| US8278937B2 | High speed detection of shunt defects in photovoltaic and optoelectronic devices | Emerging Cross-Sectional Technologies | 6 | Active |
| US6937050B1 | Non-contact mobile charge measurement with leakage band-bending and dipole correction | Physics | 5 | Expired |
| US7719294B1 | Systems configured to perform a non-contact method for determining a property of a specimen | Electricity | 5 | Active |
| US7230443B1 | Non-contact mobile charge measurement with leakage band-bending and dipole correction | Physics | 4 | Expired |
| US6335630B1 | Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge | Physics | 3 | Expired |
| US7538333B1 | Contactless charge measurement of product wafers and control of corona generation and deposition | Electricity | 2 | Active |
| US6448804B2 | Contactless total charge measurement with corona | Physics | 2 | Expired |
| US7397254B1 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Physics | 1 | Active |
| US9537444B2 | Methods and systems for characterizing photovoltaic cell and module performance at various stages in the manufacturing process | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.