Tom Miller
28Patents
9h-index
42Co-inventors
75Inventor score
Filing activity: Apr 23, 1997 → Aug 16, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10231653B2 | Advanced continuous analyte monitoring system | Physics | 808 | Active |
| US6097196A | Non-contact tunnelling field measurement for a semiconductor oxide layer | Physics | 83 | Expired |
| US6191605A | Contactless method for measuring total charge of an insulating layer on a substrate using corona charge | Physics | 76 | Expired |
| US6202029A | Non-contact electrical conduction measurement for insulating films | Physics | 64 | Expired |
| US6060709A | Apparatus and method for depositing uniform charge on a thin oxide semiconductor wafer | Electricity | 50 | Expired |
| US8253118B2 | Charged particle beam system having multiple user-selectable operating modes | Electricity | 27 | Active |
| US10687740B2 | Advanced continuous analyte monitoring system | Physics | 13 | Active |
| US8445870B2 | Charged particle beam system having multiple user-selectable operating modes | Electricity | 11 | Active |
| US10362973B2 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Emerging Cross-Sectional Technologies | 10 | Active |
| US8124942B2 | Plasma igniter for an inductively coupled plasma ion source | Electricity | 7 | Active |
| US8314409B2 | Pattern modification schemes for improved FIB patterning | Electricity | 7 | Active |
| US7714300B1 | High-speed high-efficiency solid-state electron detector | Electricity | 4 | Active |
| US8183547B2 | Dual beam system | Electricity | 3 | Active |
| US6335630B1 | Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge | Physics | 3 | Expired |
| US10052050B2 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Emerging Cross-Sectional Technologies | 2 | Active |
| US6448804B2 | Contactless total charge measurement with corona | Physics | 2 | Expired |
| US11690538B2 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Emerging Cross-Sectional Technologies | 2 | Active |
| US10312162B2 | Methods and apparatus for semiconductor sample workflow | Physics | 1 | Active |
| US9123500B2 | Automated ion beam idle | Electricity | 1 | Active |
| US8723143B2 | Plasma igniter for an inductively coupled plasma ion source | Electricity | 1 | Active |
| US11179069B2 | Advanced continuous analyte monitoring system | Physics | 1 | Active |
| US12310723B2 | Advanced continuous analyte monitoring system | Physics | 0 | Active |
| US8624206B2 | Pattern modification schemes for improved FIB patterning | Electricity | 0 | Active |
| US12396663B2 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Emerging Cross-Sectional Technologies | 0 | Active |
| US9257261B2 | Method for rapid switching between a high current mode and a low current mode in a charged particle beam system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.