Wet-dry-wet process in wet station
US6211055A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Aug 16, 1999 |
| Grant date | Apr 3, 2001 |
| Priority date | — |
| Expiry date | Aug 16, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S438/906
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A method for making conductive plugs in a semiconductor wafer. In involves the steps of: (a) forming at least one through hole in a dielectric layer, which is formed above a conductive substrate; (b) subjecting the wafer to a NH.sub.4 OH/H.sub.2 O.sub.2 wet washing process and HCl/H.sub.2 O.sub.2 wet washing process; (c) drying the wafer; (d) subjecting the wafer to a dilute hydrogen fluoride or buffered hydrogen fluoride wet washing process to remove the native oxide layer that maybe formed on the conductive substrate; (e) drying the wafer again; and (i) filling the at least one through hole with a conductive material to form at least one conductive channel. The wet washing station is modified such that the wet washing processes and the drying process are performed in the same station and without removing the wafer from the washing station during the wet washing and drying process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.