Patent · US Expired

Module with metal-ion matrix induced dendrites for interconnection

US6218629A · kind A · utility

6Cited by
6References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 20, 1999
Grant dateApr 17, 2001
Priority date
Expiry dateJan 20, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49146
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A module or assembly is formed by interposing a polymer between a carrier and a semiconductor device to be secured to the carrier. The polymer has ionized metallic particles suspended in it. Before setting or curing the polymer, the module is exposed to an electric field which induces migration of the metallic particles to the opposing pads of the carrier and semiconductor device. Such migration ultimately forms metal dendrites extending between mating pad pairs. The dendrites establish a metallurgical bond and conductive paths between the carrier and the overlying semiconductor device. When the polymer is subsequently set, the carrier and device are not only adhered to each other, but the dendrite connections are fixed and structurally reinforced to provide the needed electrically conductive paths.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.