Patent · US Expired

Approach to provide high external voltage for flash memory erase

US6240027A · kind A · utility

31Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 2000
Grant dateMay 29, 2001
Priority date
Expiry dateOct 23, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/16
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In this invention external high voltages are connected to a chip containing a flash memory that are connected to selected cells to be erased. Internal pump circuits contained on the chip are turned off while the external voltages are used. The external voltages, a high negative voltage and a high positive voltage, are connected to gates and sources respectively of selected cells to be erased by a voltage control module. The external voltages are used during manufacture during program/erase operations to perform the erase function efficiently. The internal high voltage pump circuits are used to erase flash memory cells after being assembled on a circuit board by a user. Two level shifter circuits are disclosed that form a part of the voltage control module. The level shifter circuits apply voltages to the flash memory cells and provide voltages that select and deselect the cells for erasure.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.