Circuit for driving conductive line and testing conductive line for current leakage
US6242936A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 1999 |
| Grant date | Jun 5, 2001 |
| Priority date | — |
| Expiry date | Aug 3, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A circuit (100) that drives word lines and tests a word line (102) in a semiconductor device is disclosed. A charge circuit (108) couples a supply voltage (VPP) to a charge node (106) according to a potential at a boot node (110). The charge node (106) supplies a charge voltage for the word line (102). In a standard cycle, the boot node (110) is charged to a high voltage, and maintained at the high potential, to keep the word line (102) charged. In a test cycle, the boot node (110) is charged to a high voltage, and then discharged to a low voltage, thereby isolating the charge node (106) and the word line (102). In the event the word line (102) suffers from current leakage, a drop in potential will be detected at the charge rode (106).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.