Michael Duc Ho
4Patents
3h-index
2Co-inventors
36Inventor score
Filing activity: Dec 21, 1994 → Sep 3, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6242936A | Circuit for driving conductive line and testing conductive line for current leakage | Physics | 85 | Expired |
| US5511025A | Write per bit with write mask information carried on the data path past the input data latch | Physics | 26 | Expired |
| US6088293A | Low-power column decode circuit | Physics | 6 | Expired |
| US5867421A | Integrated circuit memory device having reduced stress across large on-chip capacitor | Physics | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.