Method and testing system for measuring contact resistance for pin of integrated circuit
US6262580A · kind A · utility
Assignees
Inventor
Key dates
| Filing date | Oct 14, 1999 |
| Grant date | Jul 17, 2001 |
| Priority date | — |
| Expiry date | Oct 14, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a testing system for measuring contact resistance of a pin on an integrated circuit. An RC circuit is coupled to the integrated circuit, and a response signal of a testing signal input to the integrated circuit is monitored. The response signal has a time dependent voltage V'. Another time dependent voltage V.sub.1 for the testing signal through the RC circuit and a voltage drop across an internal circuit of the integrated circuit is illustrated. Comparing V' with V.sub.1, whether the contact resistance of the pin being tested is allowable can be determined according to the ratings or specification of the integrated circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.