Patent · US Expired

Testing method for dynamic logic keeper device

US6269461A · kind A · utility

0Cited by
13References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 27, 1998
Grant dateJul 31, 2001
Priority date
Expiry dateApr 27, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318525
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A testing device for slowly bleeding charge away from a primary node in a dynamic logic circuit. A properly functioning keeper device in the dynamic logic circuit will maintain the primary node in a precharged state even in the face of this bleeding device. If the logic circuit output flips after the bleeder device begins bleeding charge, a defective keeper device is thereby identified.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.