Patrick R. Hansen
14Patents
7h-index
14Co-inventors
55Inventor score
Filing activity: Dec 1, 1997 → Apr 9, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6163862A | On-chip test circuit for evaluating an on-chip signal using an external test signal | Physics | 434 | Expired |
| US6731179B2 | System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI) | Physics | 72 | Expired |
| US6133749A | Variable impedance output driver circuit using analog biases to match driver output impedance to load input impedance | Electricity | 40 | Expired |
| US6509778B2 | BIST circuit for variable impedance system | Physics | 26 | Expired |
| US6714113B1 | Inductor for integrated circuits | Electricity | 18 | Expired |
| US6501293B2 | Method and apparatus for programmable active termination of input/output devices | Electricity | 17 | Expired |
| US6140885A | On-chip automatic system for impedance matching in very high speed input-output chip interfacing | Electricity | 14 | Expired |
| US6542418B2 | Redundant memory array having dual-use repair elements | Physics | 5 | Expired |
| US6278339A | Termination resistance independent system for impedance matching in high speed input-output chip interfacing | Electricity | 4 | Expired |
| US6249193A | Termination impedance independent system for impedance matching in high speed input-output chip interfacing | Electricity | 3 | Expired |
| US6617986B2 | Area efficient, sequential gray code to thermometer code decoder | Electricity | 3 | Expired |
| US6441646B1 | Structure and method of alternating precharge in dynamic SOI circuits | Electricity | 3 | Expired |
| US6181155A | Method and apparatus for testing dynamic logic using an improved reset pulse | Physics | 0 | Expired |
| US6269461A | Testing method for dynamic logic keeper device | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.