Robert Dean Adams
16Patents
9h-index
21Co-inventors
68Inventor score
Filing activity: Aug 31, 1987 → Apr 22, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5313424A | Module level electronic redundancy | Physics | 102 | Expired |
| US5535164A | BIST tester for multiple memories | Physics | 98 | Expired |
| US5796745A | Memory array built-in self test circuit for testing multi-port memory arrays | Physics | 63 | Expired |
| US4782250A | CMOS off-chip driver circuits | Electricity | 52 | Expired |
| US5784323A | Test converage of embedded memories on semiconductor substrates | Physics | 32 | Expired |
| US5740098A | Using one memory to supply addresses to an associated memory during testing | Physics | 30 | Expired |
| US5790564A | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | Physics | 16 | Expired |
| US5563833A | Using one memory to supply addresses to an associated memory during testing | Physics | 16 | Expired |
| US5793592A | Dynamic dielectric protection circuit for a receiver | Electricity | 15 | Expired |
| US5802070A | Testing associative memory | Physics | 9 | Expired |
| US5771242A | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | Physics | 8 | Expired |
| US5745498A | Rapid compare of two binary numbers | Physics | 7 | Expired |
| US5761213A | Method and apparatus to determine erroneous value in memory cells using data compression | Physics | 7 | Expired |
| US6252417A | Fault identification by voltage potential signature | Physics | 5 | Expired |
| US6353903B1 | Method and apparatus for testing differential signals | Physics | 3 | Expired |
| US6269461A | Testing method for dynamic logic keeper device | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.