Patent · US Expired

Selective nitride etching with silicate ion pre-loading

US6287983A · kind A · utility

5Cited by
7References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 1998
Grant dateSep 11, 2001
Priority date
Expiry dateDec 18, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31111
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A nitride wet etch in which liquid TEOS is flowed directly into the hot phosphoric acid bath before wafer etching begins. This preloads the bath chemistry with silicate ions, and thus helps assure very high selectivity to silicon oxides.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.