Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module
US6297651A · kind A · utility
4Cited by
5References
3Claims
0Family size
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Key dates
| Filing date | Jan 26, 2000 |
| Grant date | Oct 2, 2001 |
| Priority date | — |
| Expiry date | Jan 26, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein is an electro-optic sampling probe in which the quantity of light incident on the electro-optic sampling system module can be adjusted. The probe includes an electro-optic element that has a reflective face, an optical system for transmitting a laser beam received from an external source and an electro-optic sampling optical system module as well as unit for attenuating the quantity of light of the laser beam that is received by the optical system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.