Patent · US Expired

Deadhesion method and mechanism for wafer processing

US6316363A · kind A · utility

17Cited by
54References
183Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 2, 1999
Grant dateNov 13, 2001
Priority date
Expiry dateSep 2, 2019

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB24B37/042
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method of manufacturing semiconductor devices using an improved planarization processes for the planarization of the surfaces of the wafer on which the semiconductor devices are formed. The improved planarization process includes the formation of a flat planar surface from a deformable coating on the surface of the wafer using a fixed flexible planar interface material contacting the deformable coating.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.