Patent · US Expired

Flexible and programmable BIST engine for on-chip memory array testing and characterization

US6321320A · kind A · utility

35Cited by
6References
92Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 1998
Grant dateNov 20, 2001
Priority date
Expiry dateOct 30, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/5002
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A highly flexible and complex BIST engine provides at-speed access, testing, characterization, and monitoring of on-chip memory arrays, independent of other chip circuitry such as a CPU core. Each BIST engine has a main control block, at least one address generation block having an address local control block and one or more address-data generation blocks, and at least one data generation block having a data local control block and one or more data generation blocks. Each of the local address and data control blocks are programmed independently to define operations that will be performed by the individual address and data generation blocks, respectively. The main control block in turn controls operation of the local address and data control blocks to effect desired testing, accessing, and monitoring of the on-chip memory arrays.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.