J. Michael Hill
12Patents
5h-index
12Co-inventors
55Inventor score
Filing activity: Oct 1, 1996 → Jan 26, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6321320A | Flexible and programmable BIST engine for on-chip memory array testing and characterization | Physics | 35 | Expired |
| US6141779A | Method for automatically programming a redundancy map for a redundant circuit | Physics | 19 | Expired |
| US6275442A | Address decoder and method for ITS accelerated stress testing | Physics | 9 | Expired |
| US6314039A | Characterization of sense amplifiers | Physics | 7 | Expired |
| US5787041A | System and method for improving a random access memory (RAM) | Physics | 6 | Expired |
| US6380779B1 | Edge-triggered, self-resetting pulse generator | Electricity | 5 | Expired |
| US7152192B2 | System and method of testing a plurality of memory blocks of an integrated circuit in parallel | Physics | 3 | Expired |
| US7055074B2 | Device to inhibit duplicate cache repairs | Physics | 2 | Expired |
| US6301140A | Content addressable memory cell with a bootstrap improved compare | Physics | 1 | Expired |
| US6940778B2 | System and method for reducing leakage in memory cells using wordline control | Physics | 1 | Expired |
| US6944807B2 | Method and apparatus for achieving higher product yields by using fractional portions of imbedded memory arrays | Physics | 1 | Expired |
| US7284168B2 | Method and system for testing RAM redundant integrated circuits | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.