Patent · US Expired

Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization

US6324341A · kind A · utility

4Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 26, 2000
Grant dateNov 27, 2001
Priority date
Expiry dateApr 26, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67248
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method is provided, the method comprising preheating a rapid thermal processing chamber according to a preheating recipe and processing a first plurality of workpieces in the rapid thermal processing chamber. The method also comprises performing first parameter measurements on first and second workpieces of the first plurality of workpieces, the first parameter measurements indicative of first processing differences between the first and second workpieces, and forming a first output signal corresponding to the first parameter measurements. The method further comprises adjusting the preheating recipe based on the first output signal and using the adjusted preheating recipe to preheat the rapid thermal processing chamber for processing a second plurality of workpieces in the rapid thermal processing chamber to reduce second processing differences between first and second workpieces of the second plurality of workpieces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.