Patent · US Expired

Method and system for embedded chip erase verification

US6331951A · kind A · utility

39Cited by
8References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 21, 2000
Grant dateDec 18, 2001
Priority date
Expiry dateNov 21, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3445
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and system are disclosed for verifying memory cell erasure, which may be employed in association with a dual bit memory cell architecture. The method includes selectively verifying proper erasure of one of a first bit of the cell and a second bit of the cell, determining that the dual bit memory cell is properly erased if the first and second bits of the cell are properly erased, and selectively erasing at least one of the first and second bits of the cell if one of the first and second bits is not properly erased. The method may also comprise selectively re-verifying proper erasure of one of the first and second bits after selectively erasing at least one of the first and second bits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.