Patent · US Expired

Process of forming a capacitor with multi-level interconnection technology

US6336262B1 · kind B1 · utility

89Cited by
38References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 1997
Grant dateJan 8, 2002
Priority date
Expiry dateApr 30, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49213
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A capacitor having a multilevel interconnection technology and process thereof. Also disclosed is a process of electrically connecting a capacitor to an object, comprising the steps of first obtaining a capacitor. At least one solder ball is reflowed and secured onto the capacitor. The solder ball is in electrical communication with the capacitor through a contacting means. On this reflowed solder ball a cap of low melting point metal is secured. This can be done in a number of ways. The preferred way is to positioning a mask over the solder ball such that a portion of the solder ball is exposed through openings in the mask. At least one layer of a low melting point metal is deposited on the exposed surface of the solder ball through the mask, and thereby forming a capacitor with a multilevel interconnect cap. The low melting point metal can interact with the surface of the solder ball to form a cap of an eutectic or a liquefied portion. The cap portion can then be joined to the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.