Patent · US Expired

Method for fabricating a semiconductor capacitor

US6337173B2 · kind B2 · utility

13Cited by
16References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 10, 1998
Grant dateJan 8, 2002
Priority date
Expiry dateDec 10, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/033
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating a capacitor electrode on a semiconductor substrate includes the steps of: forming a conducting layer over the semiconductor substrate; forming a photoresist layer over the conducting layer; pattering the photoresist layer through an interfering exposure step; and pattering the conducting layer using the patterned photoresist layer as a mask, thereby forming a capacitor electrode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.