Electrooptic probe
US6348787B1 · kind B1 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 30, 1999 |
| Grant date | Feb 19, 2002 |
| Priority date | — |
| Expiry date | Sep 30, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/071
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for an electrooptic sampling oscilloscope in which an electric field generated by a measured field is coupled with an electrooptic crystal. A beam is incident on this electrooptic crystal, and by the polarization state of the incident beam, the form of the measured signal is measured. The electrooptic element is supported form the end terminal side of the probe body by a probe head member that serves as the end terminal of the probe body. An insertion hole is formed from the outside up to the reflecting film on the probe head member. One end thereof is in contact with a reflecting film, the other end thereof is inserted so as to protrude from the probe head member, and at the same time, the external radial diameter of the insertion hole is formed so as to be large compared to the radial dimension of the reflected film.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.