Method and apparatus for testing differential signals
US6353903B1 · kind B1 · utility
3Cited by
13References
11Claims
0Family size
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Key dates
| Filing date | Oct 28, 1994 |
| Grant date | Mar 5, 2002 |
| Priority date | — |
| Expiry date | Oct 28, 2014 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31926
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
True and complement data signals are provided to a multiplexer, which selects one of them based on a selection signal for capture by a single scannable latch in response to a clock signal. The scannable latch then provides the captured signal for testing by testing logic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.