John Connor
23Patents
14h-index
22Co-inventors
77Inventor score
Filing activity: Jan 7, 1991 → Sep 30, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5535164A | BIST tester for multiple memories | Physics | 98 | Expired |
| US5553082A | Built-in self-test for logic circuitry at memory array output | Physics | 81 | Expired |
| US5796745A | Memory array built-in self test circuit for testing multi-port memory arrays | Physics | 63 | Expired |
| US5057039A | Electrical or communications monument for mounting along an edge of a work surface | Human Necessities | 37 | Expired |
| US5784323A | Test converage of embedded memories on semiconductor substrates | Physics | 32 | Expired |
| US5740098A | Using one memory to supply addresses to an associated memory during testing | Physics | 30 | Expired |
| US5088541A | Space dividing panel system with counter cap | Fixed Constructions | 24 | Expired |
| US6501293B2 | Method and apparatus for programmable active termination of input/output devices | Electricity | 17 | Expired |
| US5790564A | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | Physics | 16 | Expired |
| US5563833A | Using one memory to supply addresses to an associated memory during testing | Physics | 16 | Expired |
| US5929667A | Method and apparatus for protecting circuits subjected to high voltage | Electricity | 15 | Expired |
| US5793592A | Dynamic dielectric protection circuit for a receiver | Electricity | 15 | Expired |
| US6965503B2 | Electro-static discharge protection circuit | Electricity | 14 | Expired |
| US6140885A | On-chip automatic system for impedance matching in very high speed input-output chip interfacing | Electricity | 14 | Expired |
| US5815354A | Receiver input voltage protection circuit | Electricity | 11 | Expired |
| US5771242A | Memory array built-in self-test circuit having a programmable pattern generator for allowing unique read/write operations to adjacent memory cells, and method therefor | Physics | 8 | Expired |
| US5539753A | Method and apparatus for output deselecting of data during test | Physics | 8 | Expired |
| US5761213A | Method and apparatus to determine erroneous value in memory cells using data compression | Physics | 7 | Expired |
| US5745498A | Rapid compare of two binary numbers | Physics | 7 | Expired |
| US6278339A | Termination resistance independent system for impedance matching in high speed input-output chip interfacing | Electricity | 4 | Expired |
| US6353903B1 | Method and apparatus for testing differential signals | Physics | 3 | Expired |
| US6617986B2 | Area efficient, sequential gray code to thermometer code decoder | Electricity | 3 | Expired |
| US6249193A | Termination impedance independent system for impedance matching in high speed input-output chip interfacing | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.