Patent · US Expired

Process of controlling grain growth in metal films

US6361627B1 · kind B1 · utility

1Cited by
5References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2000
Grant dateMar 26, 2002
Priority date
Expiry dateMay 11, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/12903
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A process for controlling grain growth in the microstructure of thin metal films (e.g., copper or gold) deposited onto a substrate. In one embodiment, the metal film is deposited onto the substrate to form a film having a fine-grained microstructure. The film is heated in a temperature range of 70-100°C. for at least five minutes, wherein the fine-grained microstructure is converted into a stable large-grained microstructure. In another embodiment, the plated film is stored, after the step of depositing, at a temperature not greater than −20° C., wherein the fine-grained microstructure is stabilized without grain growth for the entire storage period.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.