Patent · US Expired

Vertical fuse structure for integrated circuits and a method of disconnecting the same

US6369437B1 · kind B1 · utility

5Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 12, 1999
Grant dateApr 9, 2002
Priority date
Expiry dateJan 12, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A vertical fuse structure and methods for customization of integrated circuits include a substantially vertically-oriented interconnect structure or “fuse” which provides for a more densely packed and thus smaller programmable integrated circuit. In a preferred embodiment, a vertical interconnect structure is fabricated by forming a first interconnect layer, forming an insulating layer over the first interconnect layer in which substantially vertically-oriented vias are patterned in contact with the first interconnect layer, filling the vias with a conductive plug, and forming a second interconnect layer over the insulating layer in contact with the conductive plug. The vertical interconnect structure is preferably disconnected by forming a narrow, substantially vertical disconnect cavity through the second interconnect layer and a portion of the conductive plug, thereby removing the connection between the second interconnect layer and the plug.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.