Patent · US Expired

Semiconductor memory device and a method for fabricating the same

US6376304B1 · kind B1 · utility

20Cited by
12References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2000
Grant dateApr 23, 2002
Priority date
Expiry dateJun 30, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/716

Abstract

A semiconductor memory device and a method of fabricating the same are provided, in which an interlayer film which only covers a peripheral circuit region except a memory cell array is formed above the peripheral circuit region to reduce a topological difference between both regions after bitlines are formed; therefore, a semiconductor substrate which has a plain surface as a main one can be used as a starting body with no preliminary processing thereon and a shallow trench isolation technique can also be applied. Besides, interconnects to the peripheral circuit can be led up to the surface of the device through a multi-step plug connection and thereby processing of large aspect-ratio holes, the filling up of the holes with metal and the like are unnecessary and, as a result, reliability of the process is improved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.