Patent · US Expired

Stud-cone bump for probe tips used in known good die carriers

US6376352B1 · kind B1 · utility

8Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 1, 1999
Grant dateApr 23, 2002
Priority date
Expiry dateNov 1, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19107
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of forming a membrane for use in conjunction with a semiconductor carrier and the membrane which includes an electrically insulating substrate and an interconnect pattern formed on the substrate. A stud is coupled to the interconnect pattern over the substrate by forming a gold ball, preferably by gold ball bonding techniques, and coating a portion of the gold ball with a compliant material, preferably an epoxy resin. The coating is filled with a material having sufficient hardness to be capable of penetrating the oxide film on the contact pads of semiconductor devices. The flakes are preferably silver or silver-based.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.